X-ray Diffraction in Support of Patent Litigation
SynchXray LLC. offers x-ray powder diffraction measurements of materials and pharmaceutical compounds using conventional x-ray sources, synchrotron radiation, and neutron sources to assist clients involved in patent infringement litigation.
Our services include:
Identification of primary and secondary phases present in samples.
Quantitative analysis of phase content.
Estimation of fractional crystallinity in crystalline/amorphous samples.
Pair-distribution function analysis of amorphous components.
Determination of whether or not specific compounds, or polymorphs, are present in an accused product.
Establishing the limits-of-detection for specific compounds and polymorphs.
Crystallite size distribution determinations.
Preparation of Expert Reports on our findings, responses to Expert Reports from opposing litigants.
Expert testimony at depositions and trial.
Quality Control and Assurance
Materials and Pharmaceutical Laboratories can benefit from x-ray diffraction using synchrotron sources during the process of product development:
SynchXray’s services include:
Rapid x-ray powder diffraction acquisition to assess phase purity and quality. The use of high-energy x-rays coupled with state-of-the-art area detectors allow crystalline diffraction patterns to be collected in only a few seconds per sample, allowing high sample throughput.
Accelerated sample aging studies can be performed under a wide range of temperature and humidity conditions.
Environmental sample chambers are available for investigations of sample stability against corrosion and harsh conditions.
Conventional Powder Diffraction Capabilities
SynchXray LLC now has in-house x-ray powder diffraction capabilities with the addition of a Rigaku Miniflex II diffractometer!
